High-resolution X-ray diffraction and electron microscopy study of porous GaAs substrates.

Authors: 
Lomov, A. A.
Grym, J.
Nohavica, D.
Orehov, A.S.
Vasil'ev, A. L.
Novikov, D. V.
Year: 
2013
DOI: 
10.1117/12.2019787
Bibliography format: 

Lomov, A. A. ; Grym, Jan ; Nohavica, Dušan ; Orehov, A.S. ; Vasil'ev, A. L. ; Novikov, D. V. High-resolution X-ray diffraction and electron microscopy study of porous GaAs substrates. In Orlikovsky, A.A. (ed.). International Conference Micro- and Nano-Electronics 2012 (Proc. SPIE 8700). BELLINGHAM : SPIE (2013)

Tým: 
Synthesis and characterization of nanomaterials
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